Optical system for collecting distance information within a field

专利摘要:
An optical system for collecting distance information within a field is provided. The optical system may include lenses for collecting photons from a field and may include lenses for distributing photons to a field. The optical system may include lenses that collimate photons passed by an aperture, optical filters that reject normally incident light outside of the operating wavelength, and pixels that detect incident photons. The optical system may further include illumination sources that output photons at an operating wavelength.
公开号:DK201970244A1
申请号:DKP201970244
申请日:2017-06-26
公开日:2019-04-30
发明作者:Pacala Angus；Frichtl Mark
申请人:Ouster；
IPC主号:

专利说明:

OPTICAL SYSTEM FOR COLLECTING DISTANCE INFORMATION
WITHIN A FIELD
BACKGROUND OF THE INVENTION
Field of the Invention
This invention relates generally to the field of optical sensors and more specifically to a new and useful optical system for collecting distance information in the field of optical sensors.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic representation of a system.
FIG. 2 is a schematic representation in accordance with one variation of the system.
FIG. 3 is a schematic representation in accordance with one variation of the system.
FIG. 4 is a schematic representation in accordance with one variation of the system.
FIG. 5 is a schematic representation in accordance with one variation of the system.
FIG. 6 is a schematic representation in accordance with one variation of the system.
FIG. 7 is a schematic representation in accordance with one variation of the system.
FIG. 8 is a schematic representation in accordance with one variation of the system.
FIG. 9 is a flowchart representation in accordance with one variation of the system.
FIG. 10 is a schematic representation in accordance with one variation of the system.
DK 2019 70244 A1
FIG. 11 is a schematic representation in accordance with one variation of the system.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
The following description of embodiments of the invention is not intended to limit the invention to these embodiments but rather to enable a person skilled in the art to make and use this invention. Variations, configurations, implementations, example implementations, and examples described herein are optional and are not exclusive to the variations, configurations, implementations, example implementations, and examples they describe. The invention described herein can include any and all permutations of these variations, configurations, implementations, example implementations, and examples.
1. One-Dimensional Optical System: Aperture Array
As shown in FIG. 1, a one-dimensional optical system 100 for collecting distance information within a field includes: a set of illumination sources 110 arranged along a first axis, each illumination source in the set of illumination sources 110 configured to output an illuminating beam of an operating wavelength toward a discrete spot in the field ahead of the illumination source; a bulk imaging optic 130 characterized by a focal plane opposite the field; an aperture layer 140 coincident the focal plane, defining a set of apertures 144 in a line array parallel to the first axis, and defining a stop region 146 around the set of apertures 144, each aperture in the set of apertures 144 defining a field of view in the field coincident a discrete spot output by a corresponding illumination source in the set of illumination sources 110, the stop region 146 absorbing light rays reflected from surfaces in the field outside of fields of view defined by the set of apertures 144 and passing through the bulk imaging optic 130 ; a set of lenses 150, each lens in the set of lenses 150 characterized by a second focal
DK 2019 70244 A1 length, offset from the focal plane opposite the bulk imaging optic 130 by the second focal length, aligned with an aperture in the set of apertures 144, and configured to collimate light rays passed by the aperture; an optical filter 160 adjacent the set of lenses 150 opposite the aperture layer 140 and configured to pass light rays at the operating wavelength; a set of pixels 170 adjacent the optical filter 160 opposite the set of lenses 150, each pixel in the set of pixels 170 corresponding to a lens in the set of lenses 150 and including a set of subpixels arranged along a second axis non-parallel to the first axis; and a diffuser 180 interposed between the optical filter 160 and the set of pixels 170 and configured to spread collimated light output from each lens in the set of lenses 150 across a set of subpixels of a corresponding pixel in the set of pixels 170.
1.1 Applications
Generally, the one-dimensional optical system 100 (the “system”) functions as an image sensor that, when rotated about an axis parallel to a column of apertures, collects threedimensional distance data of a volume occupied by the system. Specifically, the onedimensional optical system 100 can scan a volume to collect three-dimensional distance data that can then be reconstructed into a virtual three-dimensional representation of the volume, such as based on recorded times between transmission of illuminating beams from the illumination sources and detection of photons - likely originating from the illumination sources - incident on the set of pixels 170, based on phase-based measurements techniques, or based on any other suitable distance measurement technique. The system 100 includes: a column of offset apertures arranged behind a bulk imaging optic 130 and defining discrete fields of view in a field ahead of the bulk imaging optic 130 (that is non-overlapping fields of view beyond a threshold distance from the system); a set of illumination sources 110 that project discrete illuminating beams at an operating wavelength into (and substantially only
DK 2019 70244 A1 into) the fields of view defined by the apertures; a column of lenses that collimate light rays passed by corresponding apertures; and an optical filter 160 that selectively passes a narrow band of wavelengths of light (i.e., electromagnetic radiation) including the operating wavelength; and a set of pixels 170 that detect incident photons (e.g., count incident photons, tracks times between consecutive incident photons). The system can therefore selectively project illuminating beams into a field ahead of the system according to an illumination pattern that substantially matches - in size and geometry across a range of distances from the system - the fields of view of the apertures. In particular, the illumination sources are configured to illuminate substantially only surfaces in the field ahead of the system that can be detected by pixels in the system such that minimal power output by the system (via the illumination sources) is wasted by illuminating surfaces in the field for which the pixels are blind. The system can therefore achieve a relatively high ratio of output signal (i.e., illuminating beam power) to input signal (i.e., photons passed to an incident on the pixel array). Furthermore, the set of lenses 150 can collimate light rays passed by adjacent apertures such that light rays incident on the optical filter 160 meet the optical filter 160 at an angle of incidence of approximately 0°, thereby maintaining a relatively narrow band of wavelengths of light passed by the optical filter 160 and achieving a relatively high signal-to-noise ratio (“SNR”) for light rays reaching the set of pixels 170.
The system includes pixels arranged in a column and aligned with the apertures, and each pixel can be non-square in geometry (e.g., short and wide) to extend the sensing area of the system for a fixed aperture pitch and pixel column height. The system also includes a diffuser 180 that spreads light rays passed from an aperture through the optical filter 160 across the area of a corresponding pixel such that the pixel can detect incident photons across its full width and height thereby increasing the dynamic range of the system.
DK 2019 70244 A1
The system is described herein as projecting electromagnetic radiation into a field and detecting electromagnetic radiation reflected from a surface in the field back to bulk receiver optic. Terms “illumination beam,” “light,” “light rays,” and “photons” recited herein refer to such electromagnetic radiation. The term “channel” recited herein refers to one aperture in the aperture layer 140, a corresponding lens in the set of lenses 150, and a corresponding pixel in the set of pixels 170.
1.2 Bulk Imaging Optic
The system includes a bulk imaging optic 130 characterized by a focal plane opposite the field. Generally, the bulk imaging optic 130 functions to project incident light rays from outside the system toward the focal plane where light rays incident on a stop region 146 of the aperture layer 140 are rejected (e.g., mirrored or absorbed) and where light rays incident on apertures in the aperture layer 140 are passed into a lens characterized by a focal length and offset from the focal plane by the focal length.
In one implementation, the bulk imaging optic 130 includes a converging lens, such as a bi-convex lens (shown in FIG. 2) or a plano-convex lens, characterized by a particular focal length at the operating wavelength of the system. The bulk imaging optic 130 can also include multiple discrete lens that cooperate to project light rays toward the aperture layer 140 and that are characterized by a composite focal plane opposite the field, as shown in FIG.
11. However, the bulk imaging optic 130 can be any other suitable type of lens or combination of lenses of any other type or geometry.
1.3 Aperture Layer
As shown in FIGS. 1 and 2, the system includes an aperture layer 140 coincident the focal plane, defining a set of apertures 144 in a line array parallel to the axes of the
DK 2019 70244 A1 illumination sources, and defining a stop region 146 around the set of apertures 144, wherein each aperture in the set of apertures 144 defines a field of view in the field coincident a discrete spot output by a corresponding illumination source in the set of illumination sources 110, and wherein the stop region 146 absorbs and/or reflects light rays reflected from surfaces in the field outside of fields of view defined by the set of apertures 144 and passing through the bulk imaging optic 130. Generally, the aperture layer 140 defines an array of open regions (i.e., apertures, including one aperture per lens) and closed regions (“stop regions”) between adjacent opens. Each aperture in the aperture layer 140 defines a “pinhole” that defines a field of view for its corresponding sense channel and passes light rights reflected from an external surface within its field of the view into its corresponding lens, and each stop region 146 can block light rays incident on select regions of the focal plane from passing into the lens array, as shown in FIG. 6.
The aperture layer 140 includes a relatively thin opaque structure coinciding with (e.g., arranged along) the focal plane of the bulk imaging optic 130, as shown in FIGS. 1 and
2. For example, the aperture layer 140 can include a 10 micrometer-thick copper, silver, or nickel film deposited (e.g., plated) over a photocurable transparent polymer and then selectively etched to form the array of apertures. In a similar example, a reflective metalized layer or a light-absorbing photopolymer (e.g., a photopolymer mixed with a light absorbing dye) can be deposited onto a glass wafer and selectively cured with a photomask to form the aperture layer 140 and the set of apertures 144. Alternatively, the aperture layer 140 can include a discrete metallic film that is mechanically or chemically perforated to form the array of apertures, bonded to the lens array, and then installed over the bulk imaging optic 130 along the focal plane. However, the aperture layer 140 can include any other reflective (e.g.,
DK 2019 70244 A1 mirrored) or light-absorbing material formed in any other way to define the array of apertures along the focal plane of the bulk imaging optic 130.
In the one-dimensional optical system 100, the aperture layer 140 can define a single column of multiple discrete circular apertures of substantially uniform diameter, wherein each aperture defines an axis substantially parallel to and aligned with one lens in the lens array, as shown in FIG. 3. Adjacent apertures are offset by an aperture pitch distance greater than the aperture diameter and substantially similar to the lens pitch distance, and the aperture layer 140 defines a stop region 146 (i.e., an opaque or reflecting region) between adjacent apertures such that the apertures define discrete, non-overlapping fields of view for their corresponding sense channels. At increasingly smaller diameters up to a diffraction-limited diameter - which is a function of wavelength of incident light and numeric aperture of the bulk imaging lens - an aperture defines a narrower field of view (i.e., a field of view of smaller diameter) and passes a sharper but lower-intensity (attenuated) signal from the bulk imaging optic 130 into its corresponding lens. The aperture layer 140 can therefore define apertures of diameter: greater than the diffraction-limited diameter for the wavelength of light output by the illumination sources (e.g., 900 nm); substantially greater than the thickness of the aperture layer 140; and less than the aperture pitch distance, which is substantially equivalent to the lens pitch distance and the pixel pitch distance. In one example, aperture layer 140 can define apertures of diameters approaching the diffraction-limited diameter to maximize geometrical selectivity of the field of view of each sense channel. Alternatively, the apertures can be of diameter less that the diffraction-limited diameter for the wavelength of light output by the illumination sources. In one example, the aperture layer 140 can define apertures of diameters matched to a power output of illumination sources in the system and to a number and photon detection capacity of subpixel photodetectors in each pixel in the set of pixels 170
DK 2019 70244 A1 to achieve a target number of photons incident on each pixel within each sampling period. In this example, each aperture can define a particular diameter that achieves target attenuation range for pixels originating from a corresponding illumination source and incident on the bulk imaging optic 130 during a sampling period. In particular, because an aperture in the aperture layer 140 attenuates a signal passed to its corresponding lens and on to its corresponding pixel, the diameter of the aperture can be matched to the dynamic range of its corresponding pixel.
In one implementation, a first aperture 141 in the aperture layer 140 passes light rays - reflected from a discrete region of a surface in the field (the field of view of the sense channel) ahead of the bulk imaging optic 130 - into its corresponding lens; a stop region 146 interposed between the first aperture 141 and adjacent apertures in the aperture layer 140 blocks light rays - reflected from a region of the surface outside of the field of view of the first aperture 141 - from passing into the lens corresponding to the first aperture 141. In the one-dimensional optical system 100, the aperture layer 140 therefore defines a column of apertures that define multiple discrete, non-overlapping fields of view of substantially infinite depth of field, as shown in FIG. 2.
In this implementation, a first aperture 141 in the aperture layer 140 defines a field of view that is distinct and that does not intersect a field of view defined by another aperture in the aperture layer 140, as shown in FIG. 2. The set of illumination sources 110 includes a first illumination source 111 paired with the first aperture 141 and configured to project an illuminating beam substantially aligned with (i.e., overlapping) the field of view of the first aperture 141 in the field ahead of the bulk imaging optic 130. Furthermore, the first illumination source 111 and a bulk transmitting optic 120 can cooperate to project an illuminating beam of a cross-section substantially similar to (and slightly larger than) the
DK 2019 70244 A1 cross section of the field of view of the first aperture 141 as various distances from the bulk imaging optic 130. Therefore light output by the first illumination source 111 - paired with the first aperture 141 - and projected into the field of view of the first aperture 141 can remain substantially outside the fields of view of other apertures in the aperture layer 140.
Generally, photons projected into the field by the first illumination source 111 illuminate a particular region of a surface (or multiple surfaces) in the field within the field of view of the first sense channel and are reflected (e.g., scattered) by the surface(s); at least some of these photons reflected by the particular region of a surface may reach the bulk imaging optic 130, which directs these photons toward the focal plane. Because these photons were reflected by a region of a surface within the field of view of the first aperture 141, the bulk imaging optic 130 may project these photons into the first aperture 141, and the first aperture 141 may pass these photons into the first lens 151 (or a subset of these photons incident at an angle relative to the axis of the first aperture 141 below a threshold angle). However, because a second aperture 142 in the aperture layer 140 is offset from the first aperture 141 and because the particular region of the surface in the field illuminated via the first illumination source 111 does not (substantially) coincide with the field of view of the second aperture 142, photons reflected by the particular region of the surface and reaching the bulk imaging optic 130 are projected into the second aperture 142 and passed to a second lens 152 behind the second aperture 142, and vice versa, as shown in FIG. 2. Furthermore, a stop region 146 between the first and second apertures 142 can block photons directed toward the focal plane between the first and second apertures 142 reflected by the bulk imaging optic 130, thereby reducing crosstalk between the first and second sense channels.
For a first aperture 141 in the aperture layer 140 paired with a first illumination source 111 in the set of illumination sources 110, the first aperture 141 in the aperture layer 140
DK 2019 70244 A1 defines a first field of view and passes - into the first lens 151 - incident light rays originating at or reflected from a surface in the field coinciding with the first field of view. Because the first illumination source 111 projects an illuminating beam that is substantially coincident (and substantially the same size as or minimally larger than) the field of view defined by the first aperture 141 (as shown in FIG. 4), a signal passed into the first lens 151 by the first aperture 141 in the aperture layer 140 can exhibit a relatively high ratio of light rays originating from the first illumination source 111 to light rays originating from other illumination sources in the system. Generally, because various illumination sources in the system may output illuminating beams at different frequencies, duty cycles, and/or power levels, etc. at a particular time during operation, light rays passed from the bulk imaging optic 130 into a first pixel 171 in the set of pixels 170 but originating from an illumination source other than the first illumination source 111 paired with the first pixel 171 constitute noise at the first pixel 171. Though the relatively small diameters of apertures in the aperture layer 140 may attenuate a total light signal passed from the bulk imaging optic 130 into the set of lenses 150, each aperture in the aperture layer 140 may pass a relatively high proportion of photons originating from its corresponding illumination source than from other illumination sources in the system; that is, due to the geometry of a particular aperture and its corresponding illumination source, a particular aperture may pass a signal exhibiting a relatively high SNR to its corresponding lens and thus into its corresponding pixel. Furthermore, at smaller aperture diameters in the aperture layer 140 - and therefore smaller fields of view of corresponding channels - the system can pass less noise from solar radiation or other ambient light sources to the set of pixels 170.
In one variation, the system includes a second aperture layer interposed between the lens array and the optical filter 160, wherein the second aperture layer defines a second set of
DK 2019 70244 A1 apertures 144, each aligned with a corresponding lens in the set of lenses 150, as described above. In this variation, an aperture in the second aperture layer 140 can absorb or reflect errant light rays passed by a corresponding lens, as described above, to further reduce crosstalk between channels, thereby improving SNR within the system. Similarly, the system can additionally or alternatively include a third aperture layer interposed between the optical filter 160 and the diffuser(s) 180, wherein the third aperture layer defines a third set of apertures 144, each aligned with a corresponding lens in the set of lenses 150, as described above. In this variation, an aperture in the third aperture layer can absorb or reflect errant light rays passed by the light filter, as described above, to again reduce crosstalk between channels, thereby improving SNR within the system.
1.4 Lens Array
The system includes a set of lenses 150, wherein each lens in the set of lenses 150 is characterized by a second focal length, is offset from the focal plane opposite the bulk imaging optic 130 by the second focal length, is aligned with a corresponding aperture in the set of apertures 144, and is configured to collimate light rays passed by the corresponding aperture. Generally, a lens in the set of lenses 150 functions to collimate lights rays passed by its corresponding aperture and to pass these collimated light rays into the optical filter 160.
In the one-dimensional optical system 100, the lenses are arranged in a single column, and adjacent lenses are offset by a uniform lens pitch distance (i.e., a center-to-center-distance between adjacent pixels), as shown in FIG. 3. The set of lenses 150 is interposed between the aperture layer and the optical filter 160. In particular, each lens can include a converging lens characterized by a second focal length and can be offset from the focal plane of the bulk imaging optic 130 - opposite the bulk imaging optic 130 - by the second focal length to
DK 2019 70244 A1 preserve the aperture of the bulk imaging optic 130 and to collimate light incident on the bulk imaging optic 130 and passed by a corresponding aperture. Each lens in the set of lens can be characterized by a relatively short focal length (i.e., less than a focal length of the bulk imaging optic 130) and a relatively large marginal ray angle (e.g., a relatively high numeric aperture lens) such that the lens can capture highly-angled light rays projected toward the lens by the extent of the bulk imaging optic 130. That is, each lens in the set of lens can be characterized by a ray cone substantially matched to a ray cone of the bulk imaging optic 130.
Lenses in the set of lenses 150 can be substantially similar. A lens in the set of lenses 150 is configured to collimate light rays focused into its corresponding aperture by the bulk imaging optic 130. For example, a lens in the set of lenses 150 can include a bi-convex or plano-convex lens characterized by a focal length selected based on the size (e.g., diameter) of its corresponding aperture and the operating wavelength of the system. In this example, the focal length (/) of a lens in the set of lenses 150 can be calculated according to the formula:
where d is the diameter of the corresponding aperture in the aperture layer and λ is the operating wavelength of light output by the illumination source (e.g., 900 nm). The geometry of a lens in the set of lenses 150 can therefore be matched to the geometry of a corresponding aperture in the aperture layer such that the lens passes a substantially sharp image of light rays - at or near the operating wavelength - into the optical filter 160 and thus on to the pixel array.
However, the set of lenses 150 can include lenses of any other geometry and arranged in any other way adjacent the aperture layer.
DK 2019 70244 A1
1.5 Optical Filter
As shown in FIG. 3, the system includes an optical filter 160 adjacent the set of lenses 150 opposite the aperture layer and configured to pass light rays at the operating wavelength. Generally, the optical filter 160 receives electromagnetic radiation across a spectrum from the set of lenses 150, passes a relatively narrow band of electromagnetic radiation - including radiation at the operating wavelength - to the pixel array, and blocks electromagnetic radiation outside of the band. In particular, electromagnetic radiation other than electromagnetic radiation output by the illumination source - such as ambient light - incident on a pixel in the set of pixels 170 constitutes noise in the system. The optical filter 160 therefore functions to reject electromagnetic radiation outside of the operating wavelength or, more pragmatically, outside of a narrow wavelength band, thereby reducing noise in the system and increasing SNR.
In one implementation, the optical filter 160 includes an optical bandpass filter that passes a narrow band of electromagnetic radiation substantially centered at the operating wavelength of the system. In one example, the illumination sources output light (predominantly) at an operating wavelength of 900 nm, and the optical filter 160 is configured to pass light between 899.95 nm and 900.05 nm and to block light outside of this band.
The optical filter 160 may selectively pass and reject wavelengths of light as a function of angle of incidence on the optical filter 160. Generally, optical bandpass filters may pass wavelengths of light inversely proportional to their angle of incidence on the light optical bandpass filter. For example, for an optical filter 160 including a 0.5 nm-wide optical bandpass filter, the optical filter 160 may pass over 95% of electromagnetic radiation over a sharp band from 899.75 nm to 900.25 nm and reject approximately 100% of electromagnetic
DK 2019 70244 A1 radiation below 899.70 nm and above 900.30 nm for light rays incident on the optical filter 160 at an angle of incidence of approximately 0°. However, in this example, the optical filter 160 may pass over 95% of electromagnetic radiation over a narrow band from 899.5 nm to 900.00 nm and reject approximately 100% of electromagnetic radiation over a much wider band below 899.50 nm and above 900.30 nm for light rays incident on the optical filter 160 at an angle of incidence of approximately 15°. Therefore, the incidence plane of the optical filter 160 can be substantially normal to the axes of the lenses, and the set of lenses 150 can collimate light rays received through a corresponding aperture and output these light rays substantially normal to the incidence plane of the optical filter 160 (i.e., at an angle of incidence of approximately 0° on the optical filter). Specifically, the set of lenses 150 can output light rays toward the optical filter 160 at angles of incidence approximating 0° such that substantially all electromagnetic radiation passed by the optical filter 160 is at or very near the operating wavelength of the system.
In the one-dimensional optical system 100, the system can include a single optical filter 160 that spans the column of lens in the set of lenses 150. Alternatively, the system can include multiple optical filters 160, each adjacent a single lens or a subset of lenses in the set of lenses 150. However, the optical filter 160 can define any other geometry and can function in any other way to pass only a limited band of wavelengths of light.
1.6 Pixel Array and Diffuser
The system includes a set of pixels 170 adjacent the optical filter 160 opposite the set of lenses 150, each pixel in the set of pixels 170 corresponding to a lens in the set of lenses 150 and including a set of subpixels arranged along a second axis non-parallel to the first axis. Generally, the set of pixels 170 are offset from the optical filter 160 opposite the set of lenses
DK 2019 70244 A1
150, and each pixel in the set of pixels 170 functions to output a single signal or stream of signals corresponding to the count of photons incident on the pixel within one or more sampling periods, wherein each sampling period may be picoseconds, nanoseconds, microseconds, or milliseconds in duration.
The system also includes a diffuser 180 interposed between the optical filter 160 and the set of pixels 170 and configured to spread collimated light output from each lens in the set of lenses 150 across a set of subpixels of a single corresponding pixel in the set of pixels 170. Generally, for each lens in the set of lenses 150, the diffuser 180 functions to spread light rays - previously collimated by the lens and passed by the optical filter 160 - across the width and height of a sensing area within a corresponding pixel. The diffuser 180 can define a single optic element spanning the set of lenses 150, or the diffuser 180 can include multiple discrete optical elements, such as including one optical diffuser element aligned with each channel in the system.
In one implementation, a first pixel 171 in the set of pixels 170 includes an array of single-photon avalanche diode detectors (hereinafter “SPADs”), and the diffuser 180 spreads lights rays - previously passed by a corresponding first aperture 141, collimated by a corresponding first lens 151, and passed by the optical filter 160 - across the area of the first pixel 171, as shown in FIGS. 3, 5, and 6. Generally, adjacent apertures can be aligned and offset vertically by an aperture pitch distance, adjacent lenses can be aligned and offset vertically by a lens pitch distance substantially identical to the aperture pitch distance, and adjacent pixels can be aligned and offset vertically by a pixel pitch distance substantially identical to the lens and aperture pitch distances. However, the pixel pitch distance may accommodate only a relatively small number of (e.g., two) vertically-stacked SPADs. Each pixel in the set of pixels 170 can therefore define an aspect ratio greater than 1:1, and the
DK 2019 70244 A1 diffuser 180 can spread light rays passed by the optical filter 160 according to the geometry of a corresponding pixel in order to accommodate a larger sensing area per pixel.
In one example, each pixel in the set of pixels 170 is arranged on an image sensor, and a first pixel 171 in the set of pixels 170 includes a single row of 16 SPADs spaced along a lateral axis perpendicular to a vertical axis bisecting the column of apertures and lenses. In this example, the height of a single SPAD in the first pixel 171 can be less than the height (e.g., diameter) of the first lens 151, but the total length of the 16 SPADs can be greater than the width (e.g., diameter) of the first lens 151; the diffuser 180 can therefore converge light rays output from the first lens 151 to a height corresponding to the height of a SPAD at the plane of the first pixel 171 and can diverge light rays output from the first lens 151 to a width corresponding to the width of the 16 SPADs at the plane of the first pixel 171. In this example, the remaining pixels in the set of pixels 170 can include similar rows of SPADs, and the diffuser 180 can similarly converge and diverge light rays passed by corresponding apertures onto corresponding pixels.
In the foregoing example, the aperture layer can include a column of 16 like apertures, the set of lenses 150 can include a column of 16 like lenses arranged behind the aperture layer, and the set of pixels 170 can include a set of 16 like pixels - each including a similar array of SPADs - arranged behind the set of lenses 150. For a 6.4 mm-wide, 6.4 mm-tall image sensor, each pixel can include a single row of 16 SPADs, wherein each SPAD is electrically coupled to a remote analog front-end processing electronics/digital processing electronics circuit 240. Each SPAD can be arranged in a 400 pm-wide, 400 pm-tall SPAD area and can define an active sensing area approaching 400 μm in diameter. Adjacent SPADs can be offset by a SPAD pitch distance of 400 μm. In this example, the aperture pitch distance along the vertical column of apertures, the lens pitch distance along the vertical column of lenses, and the pixel
DK 2019 70244 A1 pitch distance along the vertical column of pixels can each be approximately 400 μm accordingly. For the first sense channel in the system (i.e., the first aperture 141, the first lens 151, and the first pixel 171, etc.), a first diffuser 180 can diverge a cylindrical column of light rays passed from the first lens 151 through the optical filter 160 - such as a column of light approximately 100 μm in diameter for an aperture layer aspect ratio of 1:4 - to a height of approximately 400 μm aligned vertically with the row of SPADs in the first pixel 171. The first diffuser can similarly diverge the cylindrical column of light rays passed from the first lens 151 through the optical filter 160 to a width of approximately 6.4 μm centered horizontally across the row of SPADs in the first pixel 171. Other diffusers 180 in the system can similarly diverge (or converge) collimated light passed by corresponding lenses across corresponding pixels in the set of pixels 170. Therefore, in this example, by connecting each SPAD (or each pixel) to a remote analog front-end processing electronics/digital processing electronics circuit 240 and by incorporating diffusers 180 that spread light passed by the optical filter 160 across the breadths and heights of corresponding pixels, the system can achieve a relatively high sensing area fill factor across the imaging sensor.
Therefore, in the one-dimensional optical system 100, pixels in the set of pixels 170 can include an array of multiple SPADS arranged in aspect ratio exceeding 1:1, and the diffuser 180 can spread light rays across corresponding non-square pixels that enables a relatively large numbers of SPADs to be tiled across a single pixel to achieve a greater dynamic range across the image sensor than an image sensor with a single SPAD per pixel, as shown in FIG. 3. In particular, by incorporating multiple SPADs per pixel (i.e., per sense channel), a first sense channel in the system can detect multiple incident photons - originating from a surface in the field bound by a field of view defined by the first aperture 141 - within the span of the dead time characteristic of the SPADs. The first sense channel can therefore
DK 2019 70244 A1 detect a “brighter” surface in its field of view. Additionally or alternatively, the first pixel 171 in the first sense channel can be sampled faster than the dead time characteristic of SPADs in the first pixel 171 because, though a first subset of SPADs in the first pixel 171 may be down (or “dead”) during a first sampling period due to collection of incident photons during the first sampling period, other SPADs in the first pixel 171 remain on (or “alive”) and can therefore collect incident photons during a subsequent sampling period. Furthermore, by incorporating pixels characterized by relatively high aspect ratios of photodetectors, the image sensor can include pixels offset by a relatively small pixel pitch, but the system 100 can still achieve a relatively high dynamic range pixel.
However, pixels in the set of pixels 170 can include any other number of SPADs arranged in any other arrays, such as in a 64-by-1 grid array (as described above), in a 32-by2 grid array, or in a 16-by-4 grid array, and the diffuser 180 can converge and/or diverge collimated light rays onto corresponding pixels accordingly in any other suitable way. Furthermore, rather than (or in addition to) SPADs, each pixel in the set of pixels 170 can include one or more linear avalanche photodiodes, Geiger mode avalanche photodiodes, photomultipliers, resonant cavity photodiodes, QUANTUM DOT detectors, or other types of photodetectors arranged as described above, and the diffuser(s) 180 can similarly converge and diverge signals passed by the optical filter(s) 160 across corresponding pixels, as described herein.
1.7 Illumination Sources
The system includes a set of illumination sources 110 arranged along a first axis, each illumination source in the set of illumination sources 110 configured to output an illuminating beam of an operating wavelength toward a discrete spot in a field ahead of the illumination
DK 2019 70244 A1 source. Generally, each illumination source functions to output an illuminating beam coincident a field of view defined by a corresponding aperture in the set of apertures 144, as shown in FIGS. 1 and 2.
In one implementation, the set of illumination sources 110 includes a bulk transmitter optic and one discrete emitter per sense channel. For example, the set of illumination sources 110 can include a monolithic VCSEL arrays including a set of discrete emitters. In this implementation, the bulk transmitter optic can be substantially identical to the bulk imaging optic 130 in material, geometry (e.g., focal length), thermal isolation, etc., and the bulk transmitter optic is adjacent and offset laterally and/or vertically from the bulk imaging optic 130. In a first example, set of illumination sources 110 includes a laser array including discrete emitters arranged in a column with adjacent emitters offset by an emitter pitch distance substantially identical to the aperture pitch distance. In this first example, each emitter outputs an illuminating beam of diameter substantially identical to or slightly greater than the diameter of a corresponding aperture in the apertures layer, and the column of emitters is arranged along the focal plane of the bulk transmitter optic such that each illuminating beam projected from the bulk transmitter optic into the field intersects and is of substantially the same size and geometry as the field of view of the corresponding sense channel, as shown in FIG. 4. Therefore, substantially all power output by each emitter in the set of illumination sources 110 can be projected into the field of view of its corresponding sense channel with relatively minimal power wasted illuminating surfaces in the field outside of the fields of view of the sense channels.
In a second example, the discrete emitters are similarly arranged in a column with adjacent emitters offset by an emitter pitch distance twice the aperture pitch distance, as shown in FIG. 2. In this second example, each emitter is characterized by an illuminating
DK 2019 70244 A1 active area (or aperture) of diameter approximately (or slightly greater than) twice the diameter of a corresponding aperture in the apertures layer, and the column of emitters is offset behind the bulk transmitter optic by twice the focal length of the bulk transmitter optic such that each illuminating beam projected from the bulk transmitter optic into the field intersects and is of substantially the same size and geometry as the field of view of the corresponding sense channel, as described above. Furthermore, for the same illumination beam power density, an illuminating beam output by an emitter in this second example may contain four times the power of an illuminating beam output by an emitter in the first example described above. The system can therefore include a set of emitter arranged according to an emitter pitch distance, configured to output illuminating beams of diameter, and offset behind the bulk transmitter optic by an offset distance as a function of a scale factor (e.g., 2.0 or 3.0) and 1) the aperture pitch distance in the aperture layer, 2) the diameter of apertures in the aperture layer, and 3) the focal length of bulk transmitter optic, respectively. The system can therefore include an illuminating subsystem that is proportionally larger than a corresponding receiver subsystem to achieve greater total output illumination power within the same beam angles and fields of view of corresponding channels in the receiver subsystem.
The system can also include multiple discrete sets of illumination sources, each set of illumination sources 110 paired with a discrete bulk transmitter optic adjacent the bulk imaging optic 130. For example, the system can include a first bulk transmitter optic, a second bulk transmitter optic, and a third bulk transmitter optic patterned radially about the bulk imaging optic 130 at a uniform radial distance from the center of the bulk imaging optic 130 and spaced apart by an angular distance of 120°. In this example, the system can include a laser array with one emitter - as described above - behind each of the first, second, and third bulk transmitter optics. Each discrete laser array and its corresponding bulk transmitter optic
DK 2019 70244 A1 can thus project a set of illuminating beams into the fields of view of defined by corresponding in the apertures in the aperture layer. Therefore, in this example, the three discrete laser arrays and the three corresponding bulk transmitter optics can cooperate to project three times the power onto the fields of view of the sense channels in the system, as compared to a single laser array and one bulk transmitter optic. Additionally or alternatively, the system can include multiple discrete layer arrays and bulk transmitter optics to both: 1) achieve a target illumination power output into the field of view of each sensing channel in the receiver subsystem with multiple lower-power emitters per sensing channel; and 2) distribute optical energy over a larger area in the near-field to achieve an optical energy density less than a threshold allowable optical energy density for the human eye.
However, the system can include any other number and configuration of illumination source sets and bulk transmitter optics configured to illuminate fields of view defined by the sense channels. The set of illumination sources 110 can also include any other suitable type of optical transmitter, such as a 1x16 optical splitter powered by a single laser diode, a sideemitting laser diode array, an LED array, or a quantum dot LED array, etc.
1.8 Fabrication
In one implementation, the bulk receiver lens, the aperture layer, the set of lenses 150, the optical filter 160, and the diffuser 180 are fabricated and then aligned with and mounted onto an image sensor. For example, the optical filter 160 can be fabricated by coating a fused silica substrate. Photoactive optical polymer can then be deposited over the optical filter 160, and a lens mold can be placed over the photoactive optical polymer and a UV light source activated to cure the photoactive optical polymer in the form of lenses patterned across the optical filter 160. Standoffs can be similarly molded or formed across the optical filter 160
DK 2019 70244 A1 via photolithography techniques, and an aperture layer defined by a selectively-cured, metallized glass wafer can then be bonded or otherwise mounted to the standoffs to form the aperture layer. The assembly can then be inverted, and a set of discrete diffusers and standoffs can be similarly fabricated across the opposite side of the optical filter 160. A discrete image sensor can then be aligned with and bonded to the standoffs, and a bulk imaging optic 130 can be similarly mounted over the aperture layer.
Alternatively, photolithography and wafer level bonding techniques can be implemented to fabricate the bulk imaging optics, the aperture layer, the set of lenses 150, the optical filter 160, and the diffuser 180 directly on to the un-diced semiconductor wafer containing the detector chips in order to simplify manufacturing, reduce cost, and reduce optical stack height for decreased pixel crosstalk.
2. One-Dimensional Optical System: Lens Tube
One variation of the system includes: a set of illumination sources 110 arranged along a first axis, each illumination source in the set of illumination sources 110 configured to output an illuminating beam of an operating wavelength toward a discrete spot in a field ahead of the illumination source; a bulk imaging optic 130 characterized by a focal plane opposite the field; a set of lens tubes 210 arranged in a line array parallel to the first axis, each lens tube in the set of lens tubes 210 including: a lens characterized by a focal length, offset from the focal plane by the focal length, and configured to collimate light rays reflected into the bulk imaging optic 130 from a discrete spot in the field illuminated by a corresponding illumination source in the set of optics into the bulk imaging optic 130; and a cylindrical wall 218 extending from the lens opposite the focal plane, defining a long axis substantially perpendicular to the first axis, and configured to absorb incident light rays reflected into the
DK 2019 70244 A1 bulk imaging optic 130 from a region in the field outside the discrete spot illuminated by the corresponding illumination source. In this variation, the system also includes: an optical filter 160 adjacent the set of lens tubes 210 opposite the focal plane and configured to pass light rays at the operating wavelength; a set of pixels 170 adjacent the optical filter 160 opposite the set of lenses 150, each pixel in the set of pixels 170 corresponding to a lens in the set of lenses 150 and including a set of subpixels aligned along a third axis perpendicular to the first axis; and a diffuser 180 interposed between the optical filter 160 and the set of pixels 170 and configured to spread collimated light output from each lens in the set of lenses 150 across a set of subpixels of a corresponding pixel in the set of pixels 170.
Generally, in this variation, the system includes a lens tube in replacement of (or in addition to) each aperture and lens pair described above. In this variation, each lens tube can be characterized by a second (short) focal length and can be offset from the focal plane of the bulk imaging optic 130 by the second focal length to preserve the aperture of the bulk imaging optic 130 and to collimate incident light received from the bulk imaging optic 130, as described above and as shown in FIGS. 5 and 7.
Each lens tube also defines an opaque cylindrical wall 218 defining an axis normal to the incidence plane of the adjacent optical filter 160 and configured to absorb incident light rays, as shown in FIG. 5. Generally, at greater axial lengths, the cylindrical wall 218 of a lens tube may absorb light rays passing through the lens tube at shallower angles to the axis of the lens tube, thereby reducing the field of view of the lens tube (which may be similar to decreasing the diameter of an aperture in the aperture layer up to the diffraction-limited diameter, as described above) and yielding an output signal of collimated light rays nearer to perpendicular to the incidence plane of the optical filter 160. Each lens tube can therefore define an elongated cylindrical wall 218 of length sufficient to achieve a target field of view
DK 2019 70244 A1 and to pass collimated light rays at maximum angles to the axis of the lens tube less than a threshold angle. In this variation, a lens tube can thus function as an aperture-sense pair described above to define a narrow field of view and to output substantially collimated light to the adjacent optical filter 160.
The cylindrical wall 218 of a lens tube can define a coarse or patterned opaque interface about a transparent (or translucent) lens material, as shown in FIG. 5, to increase absorption and decrease reflection of light rays incident on the cylindrical wall 218. Each lens tube (and each lens described above) can also be coated with an anti-reflective coating.
As shown in FIG. 9, in this variation, the set of lens tubes 210 can be fabricated by implementing photolithography techniques to pattern a photoactive optical polymer (e.g., SU8) onto the optical filter 160 (e.g., on a silicon wafer defining the optical filter). A lightabsorbing polymer can then be poured between the lens tubes and cured. A set of lenses 150 can then be fabricated (e.g., molded) separately and then bonded over the lens tubes. Alternatively, lenses can be fabricated directly onto the lens tubes by photolithography techniques. Yet alternatively, a mold for lenses can be cast directly onto the lens tubes by injecting polymer into a mold arranged over the lens tubes. A singular diffuser 180 or multiple discrete diffusers 180 can be similarly fabricated and/or assembled on the optical filter 160 opposite the lens tubes. Standoffs extending from the optical filter 160 can be similarly fabricated or installed around the diffuser(s) 180, and the image sensor can be aligned with and bonded to the standoffs opposite the optical filter 160. Other optical elements within the system (e.g., the bulk imaging lens, the bulk transmitting lens, etc.) can be fabricated according to similar techniques and with similar materials.
3. Two-Dimensional Optical System
DK 2019 70244 A1
Another variation of the system includes: a set of illumination sources 110 arranged in a first rectilinear grid array, each illumination source in the set of illumination sources 110 configured to output an illuminating beam of an operating wavelength toward a discrete spot in a field ahead of the illumination source; a bulk imaging optic 130 characterized by a focal plane opposite the field; an aperture layer coincident the focal plane, defining a set of apertures 144 in a second rectilinear grid array proportional to the first rectilinear grid array, and defining a stop region 146 around the set of apertures 144, each aperture in the set of apertures 144 defining a field of view in the field coincident a discrete spot output by a corresponding illumination source in the set of illumination sources 110, the stop region 146 absorbing light rays reflected from surfaces in the field outside of fields of view defined by the set of apertures 144 and passing through the bulk imaging optic 130; a set of lenses 150, each lens in the set of lenses 150 characterized by a second focal length, offset from the focal plane opposite the bulk imaging optic 130 by the second focal length, aligned with an aperture in the set of apertures 144, and configured to collimate light rays passed by the aperture; an optical filter 160 adjacent the set of lenses 150 opposite the aperture layer and configured to pass light rays at the operating wavelength; a set of pixels 170 adjacent the optical filter 160 opposite the set of lenses 150, each pixel in the set of pixels 170 aligned with a subset of lenses in the set of lenses 150; and a diffuser 180 interposed between the optical filter 160 and the set of pixels 170 and configured to spread collimated light output from each lens in the set of lenses 150 across a corresponding pixel in the set of pixels 170.
Generally, in this variation, the system includes a two-dimensional grid array of channels (i.e., aperture, lens, and pixel sets or lens tube and pixel sets) and is configured to image a volume occupied by the system in two dimensions. The system can collect onedimensional distance data - such as counts of incident photons within a sampling period
DK 2019 70244 A1 and/or times between consecutive photons incident on pixels of known position corresponding to known fields of view in the field - across a two-dimensional field. The onedimensional distance data can then be merged with known positions of the fields of view for each channel in the system to reconstruct a virtual three-dimensional representation of the field ahead of the system.
In this variation, the aperture layer can define a grid array of apertures, the set of lenses 150 can be arranged in a similar grid array with one lens aligned with one aperture in the aperture layer, and the set of pixels 170 can include one pixel per aperture and lens pair, as described above. For example, the aperture layer can define a 24-by-24 grid array of 200-pmdiameter apertures offset vertically and laterally by an aperture pitch distance of 300 μm, and the set of lenses 150 can similarly define a 24-by-24 grid array of lenses offset vertically and laterally by a lens pitch distance of 300 μm. In this example, the set of pixels 170 can include a 24-by-24 grid array of 300^m-square pixels, wherein each pixel includes a 3x3 square array of nine 100-μm-square SPADs.
Alternatively, in this variation, the set of pixels 170 can include one pixel per group of multiple aperture and lens pairs. In the foregoing example, the set of pixels 170 can alternatively include a 12-by-12 grid array of 600-μm-square pixels, wherein each pixel includes a 6x6 square array of 36 l00-iini-square SPADs and wherein each pixel is aligned with a group of four adjacent lenses in a square grid. In this example, for each group of four adjacent lenses, the diffuser 180: can bias collimated light rays output from a lens in the (1,1) position in the square grid upward and to the right to spread light rays passing through the (1,1) lens across the full breadth and width of the corresponding pixel; can bias collimated light rays output from a lens in the (2,1) position in the square grid upward and to the left to spread light rays passing through the (2,1) lens across the full breadth and width of the
DK 2019 70244 A1 corresponding pixel; can bias collimated light rays output from a lens in the (1,2) position in the square grid downward and to the right to spread light rays passing through the (1,2) lens across the full breadth and width of the corresponding pixel; and can bias collimated light rays output from a lens in the (2,2) position in the square grid downward and to the left to spread light rays passing through the (2,2) lens across the full breadth and width of the corresponding pixel, as shown in FIG. 8.
In the foregoing example, for each group of four illumination sources in a square grid and corresponding to one group of four lenses in a square grid, the system can actuate one illumination source in the group of four illumination sources at any given instance in time. In particular, for each group of four illumination sources in a square grid corresponding to one pixel in the set of pixels 170, the system can actuate a first illumination source 111 in a (1,1) position during a first sampling period to illuminate a field of view defined by a first aperture 141 corresponding to a lens in the (1,1) position in the corresponding group of four lenses, and the system can sample all 36 SPADs in the corresponding pixel during the first sampling period. The system can then shut down the first illumination source 111 and actuate a second illumination source 112 in a (1,2) position during a subsequent second sampling period to illuminate a field of view defined by a second aperture 142 corresponding to a lens in the (1,2) position in the corresponding group of four lenses, and the system can sample all 36 SPADs in the corresponding pixel during the second sampling period. Subsequently, the system can then shut down the first and second illumination sources 112 and actuate a third illumination source in a (2,1) position during a subsequent third sampling period to illuminate a field of view defined by a third aperture corresponding to a lens in the (2,1) position in the corresponding group of four lenses, and the system can sample all 36 SPADs in the corresponding pixel during the third sampling period. Finally, the system can shut down the
DK 2019 70244 A1 first, second, and third illumination sources and actuate a fourth illumination source in a (2,2) position during a fourth sampling period to illuminate a field of view defined by a fourth aperture corresponding to a lens in the (2,2) position in the corresponding group of four lenses, and the system can sample all 36 SPADs in the corresponding pixel during the fourth sampling period. The system can repeat this process throughout its operation.
Therefore, in the foregoing example, the system can include a set of pixels 170 arranged across an image sensor 7.2 mm in width and 7.2 mm in length and can implement a scanning schema such that each channel in the system can access (can project light rays onto) a number of SPADs otherwise necessitating a substantially larger image sensor (e.g., a 14.4 mm by 14.4 mm image sensor). In particular, the system can implement a serial scanning schema per group of illumination sources to achieve an exponential increase in the dynamic range of each channel in the system. In particular, in this variation, the system can implement the foregoing imaging techniques to increase imaging resolution of the system.
In the foregoing implementation, the system can also include a shutter 182 between each channel and the image sensor, and the system can selectively open and close each shutter 182 when the illumination source for the corresponding channel is actuated and deactivated, respectively. For example, the system can include one independently-operable electrochromic shutter 182 interposed between each lens, and the system can open the electrochromic shutter 182 over the (1,1) lens in the square-gridded group of four lenses and close electrochromic shutters 182 over the (1,2), (2,1), and (2,2) lens when the (1,1) illumination source is activated, thereby rejecting noise passing through the (1,2), (2,1), and (2,2) lens from reaching the corresponding pixel on the image sensor. The system can therefore selectively open and close shutters 182 between each channel and the image sensor to increase SNR per channel during operation. Alternatively, the system can include one independently-operable
DK 2019 70244 A1 electrochromic shutter 182 arranged over select regions of each pixel, as shown in FIG. 8, wherein each electrochromic shutter 182 is aligned with a single channel (i.e., with a single lens in the set of lenses). The system can alternatively include MEMS mechanical shutters or any other suitable type of shutter interposed between the set of lenses 150 and the image sensor.
In this variation, the system can define two-dimension grid arrays of apertures, lenses, diffusers, and/or pixels characterized by a first pitch distance along a first (e.g., X) axis and a second pitch distance - different from the first pitch distance - along a second (e.g., Y) axis. For example, the image sensor can include pixels offset by a 25pm horizontal pitch and a 300pm vertical pitch, wherein each pixel includes a single row of twelve subpixels.
However, in this variation, the two-dimensional optical system can include an array of any other number and pattern of channels (e.g., apertures, lenses (or lens tubes), and diffusers) and pixels and can execute any other suitable scanning schema to achieve higher spatial resolutions per channel than the raw pixel resolution of the image sensor. The system can additionally or alternatively include a converging optic, a diverging optic, and/or any other suitable type of optical element to spread light rights passed from a channel across the breadth of a corresponding pixel.
As a person skilled in the art will recognize from the previous detailed description and from the figures and claims, modifications and changes can be made to the embodiments of the invention without departing from the scope of this invention as defined in the following claims.
Exemplary methods, computer-readable storage media, systems, and electronic devices are set out in the following items:
DK 2019 70244 A1
1. A micro-optical receiver channel comprising:
an input aperture layer;
an optical lens layer adjacent the input aperture layer;
an optical filter layer adjacent the optical lens layer; and a pixel layer adjacent the optical filter layer.
2. The micro-optical receiver channel of item 1, wherein the input aperture layer comprises an aperture.
3. The micro-optical receiver channel of item 1 or 2, wherein the input aperture layer comprises an aperture and a stop material surrounding the aperture.
4. The micro-optical receiver channel of item 3, wherein the stop material comprises a reflective material.
5. The micro-optical receiver channel of item 3 or 4, wherein the stop material comprises a light absorbing material.
6. The micro-optical receiver channel of any of items 1-5, wherein the optical lens layer comprises a collimating lens.
7. The micro-optical receiver channel of any of items 1-6, wherein the input aperture layer comprises an aperture, and wherein the optical lens layer comprises a lens, the aperture aligned with the lens.
8. The micro-optical receiver channel of any of items 1-7, further comprising a second aperture layer between the optical lens layer and the optical filter layer.
9. The micro-optical receiver channel of any of items 1-8, wherein the optical filter layer comprises an optical bandpass filter.
10. The micro-optical receiver channel of any of items 1-9, wherein the pixel layer comprises at least one single-photon avalanche diode detector.
DK 2019 70244 A1
11. The micro-optical receiver channel of any of items 1-10, wherein the pixel layer comprises a plurality of single-photon avalanche diode detectors.
12. The micro-optical receiver channel of any of items
1-11, wherein the pixel layer comprises at least one resonant cavity photodiode.
13. The micro-optical receiver channel of any of items layer comprises a plurality of resonant cavity photodiodes.
14. The micro-optical receiver channel of any of items comprises a plurality of subpixels.
1-12, wherein the pixel
1-13, wherein the pixel
15. The micro-optical receiver channel of any of items 1-14, further comprising a diffuser between the optical filter layer and the pixel layer.
16. The micro-optical receiver channel of item 15, further comprising a third aperture layer between the optical filter layer and the diffuser.
17. A micro-optical receiver channel comprising:
an aperture surrounded by a stop region;
an optical lens adjacent the aperture;
an optical filter adjacent the optical lens; and a pixel adjacent the optical filter, wherein the aperture accepts an input cone of light containing a wide range of wavelengths, and the optical filter filters out all but a narrow band of the wavelengths centered at an operating wavelength, and wherein the pixel is configured to detect photons within the narrow band of wavelengths.
18. The micro-optical receiver channel of item 17, wherein the stop region comprises a reflective material.
19. The micro-optical receiver channel of item 17 or 18, wherein the stop region comprises a light absorbing material.
DK 2019 70244 A1
20. The micro-optical receiver channel of any of items 17-19, wherein the optical lens comprises a collimating lens.
21. The micro-optical receiver channel of any of items 17-20, wherein the aperture is aligned with the lens.
22. The micro-optical receiver channel of any of items 17-21, further comprising a second aperture between the optical lens and the optical filter.
23. The micro-optical receiver channel of any of items 17-22, wherein the optical filter layer comprises an optical bandpass filter.
24. The micro-optical receiver channel of any of items 17-23, wherein the pixel comprises at least one single-photon avalanche diode detector.
25. The micro-optical receiver channel of any of items 17-24, wherein the pixel comprises a plurality of single-photon avalanche diode detectors.
26. The micro-optical receiver channel of any of items comprises at least one resonant cavity photodiode.
27. The micro-optical receiver channel of any of items comprises a plurality of resonant cavity photodiodes.
28. The micro-optical receiver channel of any of items
17-25, wherein the pixel
17-26, wherein the pixel
17-27, wherein the pixel comprises a plurality of subpixels.
29. The micro-optical receiver channel of any of items 17-28, further comprising a diffuser between the optical filter and the pixel layer.
30. The micro-optical receiver channel of item 29, further comprising a third aperture between the optical filter and the diffuser.
31. An image sensor comprising:
a plurality of micro-optical receiver channels, each micro-optical receiver channel comprising:
DK 2019 70244 A1 an aperture;
an optical lens adjacent the aperture;
an optical filter adjacent the optical lens; and a pixel adjacent the optical filter.
32. The micro-optical receiver channel of item 31, wherein the stop region comprises a reflective material.
33. The micro-optical receiver channel of item 31 or 32, wherein the stop region comprises a light absorbing material.
34. The micro-optical receiver channel of any of items 31-33, wherein the optical lens comprises a collimating lens.
35. The micro-optical receiver channel of any of items 31-34, wherein the aperture is aligned with the lens.
36. The micro-optical receiver channel of any of items 31-35, further comprising a second aperture between the optical lens and the optical filter.
37. The micro-optical receiver channel of any of items 31-36, wherein the optical filter layer comprises an optical bandpass filter.
38. The micro-optical receiver channel of any of items 31-37, wherein the pixel comprises at least one single-photon avalanche diode detector.
39. The micro-optical receiver channel of any of items 31-38, wherein the pixel comprises a plurality of single-photon avalanche diode detectors.
40. The micro-optical receiver channel of any of items 31-39, wherein the pixel comprises at least one resonant cavity photodiode.
41. The micro-optical receiver channel of any of items 31-40, wherein the pixel comprises a plurality of resonant cavity photodiodes.
DK 2019 70244 A1
42. The micro-optical receiver channel of any of items 31-41, wherein the pixel comprises a plurality of subpixels.
43. The micro-optical receiver channel of any of items 31-42, further comprising a diffuser between the optical filter and the pixel layer.
44. The micro-optical receiver channel of item 43, further comprising a third aperture between the optical filter and the diffuser.
45. A method comprising:
providing a micro-optical receiver channel comprising:
an aperture surrounded by a stop region;
an optical lens adjacent the aperture;
an optical filter adjacent the optical lens; and a pixel adjacent the optical filter, wherein the aperture accepts an input cone of light containing a wide range of wavelengths, and the optical filter filters out all but a narrow band of the wavelengths centered at an operating wavelength, and wherein the pixel is configured to detect photons within the narrow band of wavelengths.
46. The method of item 45, wherein the stop region comprises a reflective material.
47. The method of item 45 or 46, wherein the stop region comprises a light absorbing material.
48. The method of any of items 45-47, wherein the optical lens comprises a collimating lens.
49. The method of any of items 45-48, wherein the aperture is aligned with the lens.
DK 2019 70244 A1
50. The method of any of items 45-49, further comprising a second aperture between the optical lens and the optical filter.
51. The method of any of items 45-50, wherein the optical filter layer comprises an optical bandpass filter.
52. The method of any of items 45-51, wherein the pixel comprises at least one single-photon avalanche diode detector.
53. The method of any of items 45-52, wherein the pixel comprises a plurality of single-photon avalanche diode detectors.
54. The method of any of items 45-53, wherein the pixel comprises at least one resonant cavity photodiode.
55. The method of any of items 45-54, wherein the pixel comprises a plurality of resonant cavity photodiodes.
56. The method of any of items 45-55, wherein the pixel comprises a plurality of subpixels.
57. The method of any of items 45-56, further comprising a diffuser between the optical filter and the pixel layer.
58. The method of item 57, further comprising a third aperture between the optical filter and the diffuser.
59. A method comprising:
using a micro-optical receiver channel comprising:
an aperture surrounded by a stop region;
an optical lens adjacent the aperture;
an optical filter adjacent the optical lens; and a pixel adjacent the optical filter,
DK 2019 70244 A1 wherein the aperture accepts an input cone of light containing a wide range of wavelengths, and the optical filter filters out all but a narrow band of the wavelengths centered at an operating wavelength, and wherein the pixel is configured to detect photons within the narrow band of wavelengths.
60. The method of item 59, wherein the stop region comprises a reflective material.
61. The method of item 59 or 60, wherein the stop region comprises a light absorbing material.
62. The method of any of items 59-61, wherein the optical lens comprises a collimating lens.
63. The method of any of items 59-62, wherein the aperture is aligned with the lens.
64. The method of any of items 59-63, further comprising a second aperture between the optical lens and the optical filter.
65. The method of any of items 59-64, wherein the optical filter layer comprises an optical bandpass filter.
66. The method of any of items 59-65, wherein the pixel comprises at least one single-photon avalanche diode detector.
67. The method of any of items 59-66, wherein the pixel comprises a plurality of single-photon avalanche diode detectors.
68. The method of any of items 59-67, wherein the pixel comprises at least one resonant cavity photodiode.
69. The method of any of items 59-68, wherein the pixel comprises a plurality of resonant cavity photodiodes.
DK 2019 70244 A1
70. The method of any of items 59-69, wherein the pixel comprises a plurality of subpixels.
71. The method of any of items 59-70, further comprising a diffuser between the optical filter and the pixel layer.
72. The method of item 71, further comprising a third aperture between the optical filter and the diffuser.
73. An optical channel for receiving photons and detecting the photons comprising:
a bulk imaging optic;
an aperture layer located at an imaging plane of the bulk optic;
a collimating lens layer behind the aperture layer and separated therefrom by a focal length of the collimating lens layer;
an optical filter behind the collimating lens layer; and a pixel offset from the optical filter opposite the collimating lens layer, and responsive to photons incident on the pixel.
74. The optical channel of item 73 further comprising a diffuser that spreads light rays passed from the aperture layer through the optical filter across an area of a corresponding pixel, whereby the pixel can detect incident photons across its full width and height to increase the dynamic range of the system.
75. The optical channel of item 73 or 74 wherein the pixel comprises at least one single-photon avalanche diode detector.
76. The optical channel of any of items 73-75 wherein the pixel comprises at least one resonant cavity photodiodes.
77. The optical channel of any of items 73-76, wherein the bulk imaging optic is image space telecentric.
DK 2019 70244 A1
78. A set of optical channels of any of items 73-77 having the set of pixels of the set of optical channels being arranged on a single image sensor.
79. The set of optical channels of item 78 wherein multiple sets of optical channels are fabricated on the same wafer and diced to yield multiple sets of optical channels.
80. The set of optical channels of item 78 or 79 further comprising a bulk imaging optic having apertures at a focal plane projected into a field defining fields of view for each optical channel.
81. The set of optical channels with the bulk imaging optic of item 80 further comprising a bulk transmitter optic having a set of optical emitters at a focal plane projecting light into a field defining transmitter fields of view that are overlapping with the fields of view defined by the set of optical channels, and operating at a same wavelength as the set of optical channels and a controller to form an active illumination optical sensor.
82. The active illumination optical sensor of item 81 wherein the bulk imaging optic is image space telecentric.
83. The active illumination optical sensor of item 81 or 82 wherein the set of optical emitters are arranged on a single semiconductor die.
84. The active illumination optical sensor of any of items 81-83 wherein the set of optical emitters are lasers.
85. The active illumination optical sensor of any of items 81-84 wherein the active illumination optical sensor is configured to measure the distance to an object in the scene for each transmit receiver pair.
86. The active illumination optical sensor of item 85 wherein the active illumination optical sensor is a 3D depth sensor.

权利要求:
Claims (20)
[1] What is claimed is:
1. An optical system comprising:
a bulk imaging optic having a focal plane;
an array of pixels; and an aperture layer coincident with the focal plane and disposed between the bulk imaging optic and the array of pixels, the aperture layer including a plurality of discrete apertures defining a plurality of discrete, non-overlapping fields of view beyond a threshold distance in a field external to the optical system, wherein the aperture layer and the array of pixels are arranged to form a plurality of sense channels, each sense channel in the plurality of sense channels including a pixel from the array of pixels and an aperture from the plurality of apertures that defines a field of view for the sense channel.
[2] 2. The optical system set forth in claim 1 further comprising a lens array including a plurality of lenses and wherein each sense channel in the plurality of sense channels further includes a lens from the plurality of lenses.
[3] 3. The optical system set forth in either of claims 1 or 2 wherein a sensing area of each pixel in the plurality of sense channels is larger than an area of the aperture with which the pixel shares a sense channel.
[4] 4. The optical system set forth in claim 3 wherein each pixel in the plurality of sense channels comprises a plurality of single-photon avalanche diode detectors (SPADs).
[5] 5. The optical system set forth in claim 4 wherein each SPAD is electrically coupled to digital processing electronics including a counter and a register.
DK 2019 70244 A1
[6] 6. The optical system set forth in any of claims 4 to 5 further comprising, within each sense channel, a diffuser configured to spread light from each channel across the plurality of SPADs within the channel.
[7] 7. The optical system of claim 1 wherein the aperture layer comprises a thin opaque structure arranged along a focal plane of the bulk imaging optic.
[8] 8. The optical system of claim 1 wherein adjacent apertures in the aperture layer are offset by an aperture pitch distance greater than a diameter of each aperture.
[9] 9. The optical system set forth in claim 1 wherein each pixel in the plurality of sense channels is configured to output a signal or stream of signals corresponding to a count of photons incident on the pixel within a sampling period.
[10] 10. The optical system set forth in any of claims 1 to 9 further comprising an optical filter disposed, within each sense channel, between the bulk imaging optic and the array of pixels, the optical filter configured to receive light passed through the bulk imaging optic and pass a narrow band of radiation to a pixel within the sense channel while blocking radiation outside the band.
[11] 11. The optical system set forth in claim 10 wherein the system is configured to perform distance measurements and further comprises:
a bulk transmitter optic; and an illumination source comprising a plurality of emitters, each emitter in the plurality of emitters configured to project a discrete illuminating beam at an operating wavelength through the bulk transmitter optic into the field external to the optical system; and
DK 2019 70244 A1 wherein the optical filter within each sense channel is configured to pass a band of wavelengths of light including the operating wavelength while blocking light outside the band and wherein each pixel in the array of pixels is configured to receive light from a corresponding one of the plurality of emitters.
[12] 12. The optical system set forth in claim 11 wherein the illumination source comprises a plurality of lasers.
[13] 13. The optical system of claim 12 wherein the plurality of lasers are arranged in an array and configured to project a plurality of discrete illuminating beams in a field ahead of the optical system according to an illumination pattern that substantially matches, in size and geometry across a range of distances from the system, the plurality of discrete, non-overlapping fields of view of the plurality of sense channels.
[14] 14. The optical system set forth in claim 12 wherein the plurality of lasers are a monolithic vertical cavity surface emitting laser (VCSEL) array.
[15] 15. The optical system set forth in any of claims 11 to 14 wherein the system is configured to function as an image sensor that, when rotated about an axis parallel to a column of apertures, collects three-dimensional distance data that can be reconstructed into a virtual three-dimensional representation of a volume occupied by the system.
[16] 16. An optical system for performing distance measurements, the optical system comprising:
a bulk transmitter optic;
an illumination source comprising a plurality of lasers, each laser in the plurality of lasers configured to project a discrete illuminating beam at an operating wavelength through the bulk transmitter optic into a field external to the optical system;
DK 2019 70244 A1 a bulk imaging optic having a focal plane;
a lens array including a plurality of lenses;
a pixel array comprising a plurality of pixels; and an aperture layer coincident with the focal plane and disposed between the bulk imaging optic and the pixel array, the aperture layer including a plurality of discrete apertures defining a plurality of discrete, non-overlapping fields of view beyond a threshold distance in a field external to the optical system, wherein the aperture layer, lens array and pixel array are arranged to form a plurality of sense channels, each sense channel in the plurality of sense channels including a pixel from the pixel array, a lens from the plurality of lenses, and an aperture from the plurality of apertures that defines a field of view for the sense channel.
[17] 17. The optical system of claim 16 wherein a sensing area of each pixel in the plurality of sense channels is larger than an area of its corresponding aperture in the plurality of apertures.
[18] 18. The optical system of claim 17 wherein each pixel in the pixel array comprises a plurality of SPADs distributed across its sensing area.
[19] 19. The optical system of any of claims 16 to 18 further comprising, within each channel in the plurality of sense channels, an optical filter disposed between the bulk receiving optic and the pixel array, the optical filter configured to receive light passed through the bulk receiving optic and pass a narrow band of radiation while blocking radiation outside the band.
[20] 20. The optical system of claim 19 wherein each laser in the plurality of lasers is a VCSEL.

类似技术:

---

公开号 | 公开日 | 专利标题

---

US11202056B2|2021-12-14|Optical system with multiple light emitters sharing a field of view of a pixel detector

---

US10063849B2|2018-08-28|Optical system for collecting distance information within a field

---

AU2018269000B2|2021-03-11|Optical imaging transmitter with brightness enhancement

---

AU2017330180B2|2019-06-27|Optical system for collecting distance information within a field

---

CN109983312B|2022-03-22|Optical system for collecting distance information within a field

---

CN113419247A|2021-09-21|Laser detection system

同族专利:

---

公开号 | 公开日

---

US20210274148A1|2021-09-02|

---

KR102309478B1|2021-10-07|

---

DE112017004806T5|2019-06-19|

---

US11202056B2|2021-12-14|

---

GB201905868D0|2019-06-12|

---

IL265562D0|2019-05-30|

---

US20180359460A1|2018-12-13|

---

KR20210122905A|2021-10-12|

---

CN109983312A|2019-07-05|

---

US20180152691A1|2018-05-31|

---

KR20190058588A|2019-05-29|

---

WO2018057084A1|2018-03-29|

---

GB2569749A|2019-06-26|

---

US20170289524A1|2017-10-05|

---

SE1950477A1|2019-04-17|

---

US9992477B2|2018-06-05|

---

US11190750B2|2021-11-30|

---

CA3038038A1|2018-03-29|

---

US11196979B2|2021-12-07|

---

US11025885B2|2021-06-01|

---

US20210306609A1|2021-09-30|

---

US11178381B2|2021-11-16|

---

JP2020501109A|2020-01-16|

---

US20200036959A1|2020-01-30|

引用文献:

---

公开号 | 申请日 | 公开日 | 申请人 | 专利标题

---

---

US672262A|1900-11-16|1901-04-16|Charles Hook Adrean|Harness attachment.|

---

US4358851A|1980-02-28|1982-11-09|Xerox Corporation|Fiber optic laser device and light emitter utilizing the device|

---

US4602289A|1982-05-31|1986-07-22|Tokyo Shibaura Denki Kabushiki Kaisha|Solid state image pick-up device|

---

JPS58211677A|1982-06-02|1983-12-09|Nissan Motor Co Ltd|Optical radar device|

---

DE3426868A1|1984-07-20|1986-01-30|LITEF Litton Technische Werke der Hellige GmbH, 7800 Freiburg|METHOD AND DEVICE FOR READING THE TURN RATE BY MEANS OF A PASSIVE OPTICAL RESONATOR|

---

US4676599A|1985-08-14|1987-06-30|The United States Of America As Represented By The Secretary Of The Air Force|Micro-optical lens holder|

---

US4744667A|1986-02-11|1988-05-17|University Of Massachusetts|Microspectrofluorimeter|

---

US4851664A|1988-06-27|1989-07-25|United States Of America As Represented By The Secretary Of The Navy|Narrow band and wide angle hemispherical interference optical filter|

---

JPH036407A|1989-06-03|1991-01-11|Daido Steel Co Ltd|Measuring device for shape of outer periphery|

---

NL9100248A|1991-02-13|1992-09-01|Philips & Du Pont Optical|DEVICE FOR MEASURING THE REFLECTION AND / OR TRANSMISSION OF AN ARTICLE.|

---

US5267016A|1991-11-27|1993-11-30|United Technologies Corporation|Laser diode distance measurement|

---

US5188286A|1991-12-18|1993-02-23|International Business Machines Corporation|Thermoelectric piezoelectric temperature control|

---

US6133989A|1993-02-09|2000-10-17|Advanced Scientific Concepts, Inc.|3D imaging laser radar|

---

US5288992A|1992-12-15|1994-02-22|Gte Laboratories Incorporated|Wide angle, narrow band optical filter|

---

JPH0749417A|1993-08-06|1995-02-21|Fujitsu Ltd|Interference filter assembly|

---

EP0679864A4|1993-09-30|1997-12-17|Komatsu Mfg Co Ltd|Confocal optical apparatus.|

---

JP3404607B2|1993-09-30|2003-05-12|株式会社小松製作所|Confocal optics|

---

JP2919267B2|1994-05-26|1999-07-12|松下電工株式会社|Shape detection method and device|

---

JP3251150B2|1994-12-29|2002-01-28|日本板硝子株式会社|Flat microlens array and method of manufacturing the same|

---

JP3350918B2|1996-03-26|2002-11-25|株式会社高岳製作所|Two-dimensional array confocal optical device|

---

JPH09331107A|1996-06-11|1997-12-22|Canon Inc|Wavelength-variable light source, wavelength control method thereof, and wavelength multiplex transmission network|

---

GB9618720D0|1996-09-07|1996-10-16|Philips Electronics Nv|Electrical device comprising an array of pixels|

---

US6043873A|1997-01-10|2000-03-28|Advanced Optical Technologies, Llc|Position tracking system|

---

JP3816632B2|1997-05-14|2006-08-30|オリンパス株式会社|Scanning microscope|

---

US6362482B1|1997-09-16|2002-03-26|Advanced Scientific Concepts, Inc.|High data rate smart sensor technology|

---

US6721262B1|1997-09-22|2004-04-13|Seagate Technology Llc|Aperture stop for a flying optical head|

---

US5953110A|1998-04-23|1999-09-14|H.N. Burns Engineering Corporation|Multichannel laser radar|

---

JP2000138792A|1998-10-30|2000-05-16|Sharp Corp|Image sensor and its manufacture|

---

US6201293B1|1998-11-19|2001-03-13|Xerox Corporation|Electro optical devices with reduced filter thinning on the edge pixel photosites and method of producing same|

---

ES2199822T3|1999-03-18|2004-03-01|Siemens Aktiengesellschaft|MEASUREMENT SYSTEM OF THE DISTANCE OF LOCAL RESOLUTION.|

---

US6564168B1|1999-09-14|2003-05-13|Immersion Corporation|High-resolution optical encoder with phased-array photodetectors|

---

US6414746B1|1999-11-24|2002-07-02|Advanced Scientific Concepts, Inc.|3-D imaging multiple target laser radar|

---

TW527518B|2000-07-14|2003-04-11|Massachusetts Inst Technology|Method and system for high resolution, ultra fast, 3-D imaging|

---

US7045833B2|2000-09-29|2006-05-16|Board Of Regents, The University Of Texas System|Avalanche photodiodes with an impact-ionization-engineered multiplication region|

---

US6707230B2|2001-05-29|2004-03-16|University Of North Carolina At Charlotte|Closed loop control systems employing relaxor ferroelectric actuators|

---

DE10127204A1|2001-06-05|2003-03-20|Ibeo Automobile Sensor Gmbh|Registration procedure and device|

---

US7091462B2|2002-08-26|2006-08-15|Jds Uniphase Corporation|Transmitter with laser monitoring and wavelength stabilization circuit|

---

DE10244641A1|2002-09-25|2004-04-08|Ibeo Automobile Sensor Gmbh|Optoelectronic position monitoring system for road vehicle has two pulsed lasers, sensor and mechanical scanner with mirror at 45 degrees on shaft with calibration disk driven by electric motor|

---

JP2006517340A|2003-01-23|2006-07-20|オーボテックリミテッド|System and method for providing high intensity illumination|

---

JP4427954B2|2003-02-13|2010-03-10|アイシン精機株式会社|Monitoring device|

---

US20040223071A1|2003-05-08|2004-11-11|David Wells|Multiple microlens system for image sensors or display units|

---

US7295330B2|2003-07-11|2007-11-13|Chow Peter P|Film mapping system|

---

US7266248B2|2003-08-08|2007-09-04|Hewlett-Packard Development Company, L.P.|Method and apparatus for generating data representative of an image|

---

DE10345555A1|2003-09-30|2005-05-04|Osram Opto Semiconductors Gmbh|Radiation emitting and receiving semiconductor component comprises a radiation producing region having a composition which is different from a radiation absorbing region|

---

US7433042B1|2003-12-05|2008-10-07|Surface Optics Corporation|Spatially corrected full-cubed hyperspectral imager|

---

US7808706B2|2004-02-12|2010-10-05|Tredegar Newco, Inc.|Light management films for displays|

---

US7279764B2|2004-06-01|2007-10-09|Micron Technology, Inc.|Silicon-based resonant cavity photodiode for image sensors|

---

USD531525S1|2004-11-02|2006-11-07|Sick Ag|Optoelectronic sensor|

---

EP1880165A2|2005-03-24|2008-01-23|Infotonics Technology Center, Inc.|Hyperspectral imaging system and methods thereof|

---

WO2006116637A2|2005-04-27|2006-11-02|Massachusetts Institute Of Technology|Raman spectroscopy for non-invasive glucose measurements|

---

US7738026B2|2005-05-02|2010-06-15|Andrew G. Cartlidge|Increasing fill-factor on pixelated sensors|

---

US8294809B2|2005-05-10|2012-10-23|Advanced Scientific Concepts, Inc.|Dimensioning system|

---

EP1889111A2|2005-05-25|2008-02-20|Massachusetts Institute of Technology|Multifocal imaging systems and methods|

---

AT385044T|2005-09-19|2008-02-15|Fiat Ricerche|MULTIFUNCTIONAL OPTICAL SENSOR WITH A MICROLINE-COUPLED MATRIX OF PHOTODETECTORS|

---

JP4967296B2|2005-10-03|2012-07-04|株式会社ニコン|Imaging device, focus detection apparatus, and imaging system|

---

EP1969312B1|2005-12-08|2017-03-29|Advanced Scientific Concepts INC.|Laser ranging, tracking and designation using 3-d focal planes|

---

US7421159B2|2005-12-13|2008-09-02|Board of Supervisor of Louisiana State University and Agricultural and Mechanical College|Integral pre-aligned micro-optical systems|

---

EP1969395B1|2005-12-19|2017-08-09|Leddartech Inc.|Object-detecting lighting system and method|

---

DE102006004802B4|2006-01-23|2008-09-25|Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.|Image acquisition system and method for producing at least one image capture system|

---

US7423821B2|2006-03-24|2008-09-09|Gentex Corporation|Vision system|

---

GB0608923D0|2006-05-05|2006-06-14|Visitech Internat Ltd|2-d array laser confocal scanning microscope and methods of improving image quality in such microscope|

---

KR100782470B1|2006-05-22|2007-12-05|삼성에스디아이 주식회사|laser irradiation device and fabrication method of organic light emitting display device using the same|

---

US7873601B1|2006-06-29|2011-01-18|Emc Corporation|Backup of incremental metadata in block based backup systems|

---

CN101688774A|2006-07-13|2010-03-31|威力登音响公司|High definition lidar system|

---

US8767190B2|2006-07-13|2014-07-01|Velodyne Acoustics, Inc.|High definition LiDAR system|

---

EP2092306B1|2006-12-12|2010-08-04|Koninklijke Philips Electronics N.V.|Sample concentration detector with temperature compensation|

---

US7683962B2|2007-03-09|2010-03-23|Eastman Kodak Company|Camera using multiple lenses and image sensors in a rangefinder configuration to provide a range map|

---

WO2008120217A2|2007-04-02|2008-10-09|Prime Sense Ltd.|Depth mapping using projected patterns|

---

EP1978394A1|2007-04-06|2008-10-08|Global Bionic Optics Pty Ltd.|Optical system for increasing depth of field|

---

CA2635155C|2007-06-18|2015-11-24|Institut National D'optique|Method for detecting objects with visible light|

---

WO2008155770A2|2007-06-19|2008-12-24|Prime Sense Ltd.|Distance-varying illumination and imaging techniques for depth mapping|

---

JP5671345B2|2007-12-21|2015-02-18|レッダーテック インコーポレイテッド|Detection and ranging method|

---

TWI358606B|2007-12-28|2012-02-21|Ind Tech Res Inst|Method for three-dimension measurement and an|

---

US8384997B2|2008-01-21|2013-02-26|Primesense Ltd|Optical pattern projection|

---

EP2124069B1|2008-03-20|2012-01-25|Sick Ag|Omnidirectional Lidar system|

---

WO2009124601A1|2008-04-11|2009-10-15|Ecole Polytechnique Federale De Lausanne Epfl|Time-of-flight based imaging system using a display as illumination source|

---

US9041915B2|2008-05-09|2015-05-26|Ball Aerospace & Technologies Corp.|Systems and methods of scene and action capture using imaging system incorporating 3D LIDAR|

---

US8531650B2|2008-07-08|2013-09-10|Chiaro Technologies LLC|Multiple channel locating|

---

US8456517B2|2008-07-09|2013-06-04|Primesense Ltd.|Integrated processor for 3D mapping|

---

CN201298079Y|2008-11-17|2009-08-26|南京德朔实业有限公司|Laser range finding apparatus|

---

JP2010128122A|2008-11-27|2010-06-10|Olympus Corp|Imaging apparatus|

---

US20100204964A1|2009-02-09|2010-08-12|Utah State University|Lidar-assisted multi-image matching for 3-d model and sensor pose refinement|

---

US9164689B2|2009-03-30|2015-10-20|Oracle America, Inc.|Data storage system and method of processing a data access request|

---

US8717417B2|2009-04-16|2014-05-06|Primesense Ltd.|Three-dimensional mapping and imaging|

---

US7876456B2|2009-05-11|2011-01-25|Mitutoyo Corporation|Intensity compensation for interchangeable chromatic point sensor components|

---

US8743176B2|2009-05-20|2014-06-03|Advanced Scientific Concepts, Inc.|3-dimensional hybrid camera and production system|

---

WO2010141631A1|2009-06-02|2010-12-09|Velodyne Acoustics, Inc.|Color lidar scanner|

---

US8504529B1|2009-06-19|2013-08-06|Netapp, Inc.|System and method for restoring data to a storage device based on a backup image|

---

US9417326B2|2009-06-22|2016-08-16|Toyota Motor Europe Nv/Sa|Pulsed light optical rangefinder|

---

US8478799B2|2009-06-26|2013-07-02|Simplivity Corporation|Namespace file system accessing an object store|

---

US8803967B2|2009-07-31|2014-08-12|Mesa Imaging Ag|Time of flight camera with rectangular field of illumination|

---

US8330840B2|2009-08-06|2012-12-11|Aptina Imaging Corporation|Image sensor with multilayer interference filters|

---

US7995708B2|2009-08-14|2011-08-09|Varian Medical Systems, Inc.|X-ray tube bearing shaft and hub|

---

CN102006402B|2009-08-28|2014-02-19|鸿富锦精密工业（深圳）有限公司|Image pick-up device and identity identification method thereof|

---

DE102009049387B4|2009-10-14|2016-05-25|Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.|Apparatus, image processing apparatus and method for optical imaging|

---

US20110116262A1|2009-11-13|2011-05-19|Phoseon Technology, Inc.|Economical partially collimating reflective micro optical array|

---

JP5588310B2|2009-11-15|2014-09-10|プライムセンスリミテッド|Optical projector with beam monitor|

---

US8514491B2|2009-11-20|2013-08-20|Pelican Imaging Corporation|Capturing and processing of images using monolithic camera array with heterogeneous imagers|

---

US20150358601A1|2009-12-23|2015-12-10|Mesa Imaging Ag|Optical Filter on Objective Lens for 3D Cameras|

---

US8786757B2|2010-02-23|2014-07-22|Primesense Ltd.|Wideband ambient light rejection|

---

US20110242355A1|2010-04-05|2011-10-06|Qualcomm Incorporated|Combining data from multiple image sensors|

---

US9811532B2|2010-05-03|2017-11-07|Panzura, Inc.|Executing a cloud command for a distributed filesystem|

---

US8805967B2|2010-05-03|2014-08-12|Panzura, Inc.|Providing disaster recovery for a distributed filesystem|

---

US8799414B2|2010-05-03|2014-08-05|Panzura, Inc.|Archiving data for a distributed filesystem|

---

US9742564B2|2010-05-14|2017-08-22|Oracle International Corporation|Method and system for encrypting data|

---

US8612699B2|2010-06-25|2013-12-17|International Business Machines Corporation|Deduplication in a hybrid storage environment|

---

NL2004996C2|2010-06-29|2011-12-30|Cyclomedia Technology B V|A METHOD FOR MANUFACTURING A DIGITAL PHOTO, AT LEAST PART OF THE IMAGE ELEMENTS INCLUDING POSITION INFORMATION AND SUCH DIGITAL PHOTO.|

---

DE102010031535A1|2010-07-19|2012-01-19|Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.|An image pickup device and method for picking up an image|

---

USD659030S1|2010-07-30|2012-05-08|Sick Ag|Optoelectronic sensor|

---

CN103262090B|2010-10-27|2017-01-25|马普科技促进协会|Protecting data integrity with storage leases|

---

US8285133B2|2010-12-03|2012-10-09|Research In Motion Limited|Dynamic lighting control in hybrid camera-projector device|

---

US9131136B2|2010-12-06|2015-09-08|Apple Inc.|Lens arrays for pattern projection and imaging|

---

JP2012128270A|2010-12-16|2012-07-05|Denso Corp|Interference filter assembly|

---

EP2469295A1|2010-12-23|2012-06-27|André Borowski|3D landscape real-time imager and corresponding imaging methods|

---

US8717488B2|2011-01-18|2014-05-06|Primesense Ltd.|Objective optics with interference filter|

---

JP2012202776A|2011-03-24|2012-10-22|Toyota Central R&D Labs Inc|Distance measuring device|

---

US8908159B2|2011-05-11|2014-12-09|Leddartech Inc.|Multiple-field-of-view scannerless optical rangefinder in high ambient background light|

---

US20120320164A1|2011-06-16|2012-12-20|Lenny Lipton|Stereoscopic camera with polarizing apertures|

---

DE102011107360A1|2011-06-29|2013-01-03|Karlsruher Institut für Technologie|Micro-optical element, micro-optical array and optical sensor system|

---

US8645810B2|2011-07-31|2014-02-04|Sandisk Technologies Inc.|Fast detection of convergence or divergence in iterative decoding|

---

US8908277B2|2011-08-09|2014-12-09|Apple Inc|Lens array projector|

---

DE102011052802B4|2011-08-18|2014-03-13|Sick Ag|3D camera and method for monitoring a room area|

---

US8797512B2|2011-09-15|2014-08-05|Advanced Scientific Concepts, Inc.|Automatic range corrected flash ladar camera|

---

US20160150963A1|2011-09-26|2016-06-02|Michael Lee Roukes|One-photon integrated neurophotonic systems|

---

IN2014CN02966A|2011-11-04|2015-07-03|Imec|

---

US8762798B2|2011-11-16|2014-06-24|Stec, Inc.|Dynamic LDPC code rate solution|

---

US8849759B2|2012-01-13|2014-09-30|Nexenta Systems, Inc.|Unified local storage supporting file and cloud object access|

---

US8743923B2|2012-01-31|2014-06-03|Flir Systems Inc.|Multi-wavelength VCSEL array to reduce speckle|

---

JP5985661B2|2012-02-15|2016-09-06|アップル インコーポレイテッド|Scan depth engine|

---

US9335220B2|2012-03-22|2016-05-10|Apple Inc.|Calibration of time-of-flight measurement using stray reflections|

---

JP6309459B2|2012-02-15|2018-04-11|ヘプタゴン・マイクロ・オプティクス・ピーティーイー・エルティーディーＨｅｐｔａｇｏｎ Ｍｉｃｒｏ Ｏｐｔｉｃｓ Ｐｔｅ．Ｌｔｄ．|Time-of-flight camera with stripe lighting|

---

JP2013181912A|2012-03-02|2013-09-12|Seiko Epson Corp|Component analyzer|

---

WO2013140307A1|2012-03-22|2013-09-26|Primesense Ltd.|Gimbaled scanning mirror array|

---

US9195914B2|2012-09-05|2015-11-24|Google Inc.|Construction zone sign detection|

---

US9071763B1|2012-09-26|2015-06-30|Google Inc.|Uniform illumination image capture|

---

US9383753B1|2012-09-26|2016-07-05|Google Inc.|Wide-view LIDAR with areas of special attention|

---

US9398264B2|2012-10-19|2016-07-19|Qualcomm Incorporated|Multi-camera system using folded optics|

---

US9019267B2|2012-10-30|2015-04-28|Apple Inc.|Depth mapping with enhanced resolution|

---

US9111444B2|2012-10-31|2015-08-18|Raytheon Company|Video and lidar target detection and tracking system and method for segmenting moving targets|

---

US9281841B2|2012-10-31|2016-03-08|Avago Technologies General Ip Pte. Ltd.|Load balanced decoding of low-density parity-check codes|

---

WO2014080299A1|2012-11-21|2014-05-30|Nokia Corporation|A module for plenoptic camera system|

---

KR102004987B1|2012-12-11|2019-07-29|삼성전자주식회사|Photon counting detector and Readout circuit|

---

US9823351B2|2012-12-18|2017-11-21|Uber Technologies, Inc.|Multi-clad fiber based optical apparatus and methods for light detection and ranging sensors|

---

CN103048046B|2012-12-21|2015-02-25|浙江大学|Double-beam spectrometer|

---

US20160047901A1|2012-12-25|2016-02-18|Quanergy Systems, Inc.|Robust lidar sensor for broad weather, shock and vibration conditions|

---

DE112013006324T5|2012-12-31|2015-10-15|Iee International Electronics & Engineering S.A.|An optical system for generating a structured light field from a series of light sources through a refractive or reflective light structuring element|

---

US9285477B1|2013-01-25|2016-03-15|Apple Inc.|3D depth point cloud from timing flight of 2D scanned light beam pulses|

---

US20140211194A1|2013-01-27|2014-07-31|Quanergy Systems, Inc.|Cost-effective lidar sensor for multi-signal detection, weak signal detection and signal disambiguation and method of using same|

---

US9063549B1|2013-03-06|2015-06-23|Google Inc.|Light detection and ranging device with oscillating mirror driven by magnetically interactive coil|

---

US9086273B1|2013-03-08|2015-07-21|Google Inc.|Microrod compression of laser beam in combination with transmit lens|

---

US9470520B2|2013-03-14|2016-10-18|Apparate International C.V.|LiDAR scanner|

---

US9267787B2|2013-03-15|2016-02-23|Apple Inc.|Depth scanning with multiple emitters|

---

WO2014150856A1|2013-03-15|2014-09-25|Pelican Imaging Corporation|Array camera implementing quantum dot color filters|

---

CN103234527B|2013-04-07|2015-06-24|南京理工大学|Multispectral light-field camera|

---

US9164511B1|2013-04-17|2015-10-20|Google Inc.|Use of detected objects for image processing|

---

US10132928B2|2013-05-09|2018-11-20|Quanergy Systems, Inc.|Solid state optical phased array lidar and method of using same|

---

CN109755859B|2013-06-19|2021-12-17|苹果公司|Integrated structured light projector|

---

US10078137B2|2013-06-21|2018-09-18|Irvine Sensors Corp.|LIDAR device and method for clear and degraded environmental viewing conditions|

---

US20150002636A1|2013-06-28|2015-01-01|Cable Television Laboratories, Inc.|Capturing Full Motion Live Events Using Spatially Distributed Depth Sensing Cameras|

---

BE1021971B1|2013-07-09|2016-01-29|Xenomatix Nv|ENVIRONMENTAL SENSOR SYSTEM|

---

US9268012B2|2013-07-12|2016-02-23|Princeton Optronics Inc.|2-D planar VCSEL source for 3-D imaging|

---

US20150260830A1|2013-07-12|2015-09-17|Princeton Optronics Inc.|2-D Planar VCSEL Source for 3-D Imaging|

---

US8742325B1|2013-07-31|2014-06-03|Google Inc.|Photodetector array on curved substrate|

---

GB2543655B|2013-08-02|2017-11-01|Verifood Ltd|Compact spectrometer comprising a diffuser, filter matrix, lens array and multiple sensor detector|

---

US10126412B2|2013-08-19|2018-11-13|Quanergy Systems, Inc.|Optical phased array lidar system and method of using same|

---

US8836922B1|2013-08-20|2014-09-16|Google Inc.|Devices and methods for a rotating LIDAR platform with a shared transmit/receive path|

---

JP6476658B2|2013-09-11|2019-03-06|ソニー株式会社|Image processing apparatus and method|

---

US9299731B1|2013-09-30|2016-03-29|Google Inc.|Systems and methods for selectable photodiode circuits|

---

US9425654B2|2013-09-30|2016-08-23|Google Inc.|Contactless electrical coupling for a rotatable LIDAR device|

---

US9368936B1|2013-09-30|2016-06-14|Google Inc.|Laser diode firing system|

---

WO2015052616A1|2013-10-09|2015-04-16|Koninklijke Philips N.V.|Monolithic led arrays for uniform and high-brightness light sources|

---

US9299732B2|2013-10-28|2016-03-29|Omnivision Technologies, Inc.|Stacked chip SPAD image sensor|

---

US20150124094A1|2013-11-05|2015-05-07|Delphi Technologies, Inc.|Multiple imager vehicle optical sensor system|

---

US10203399B2|2013-11-12|2019-02-12|Big Sky Financial Corporation|Methods and apparatus for array based LiDAR systems with reduced interference|

---

CN106463565B|2013-11-22|2018-06-01|优步技术公司|Laser radar scanner is calibrated|

---

JP6292533B2|2013-12-06|2018-03-14|株式会社リコー|Object detection device and sensing device|

---

KR101582572B1|2013-12-24|2016-01-11|엘지전자 주식회사|Driver assistance apparatus and Vehicle including the same|

---

US20150186287A1|2013-12-30|2015-07-02|Michael Henry Kass|Using Memory System Programming Interfacing|

---

US20150192677A1|2014-01-03|2015-07-09|Quanergy Systems, Inc.|Distributed lidar sensing system for wide field of view three dimensional mapping and method of using same|

---

US10061111B2|2014-01-17|2018-08-28|The Trustees Of Columbia University In The City Of New York|Systems and methods for three dimensional imaging|

---

JP2015137987A|2014-01-24|2015-07-30|アズビル株式会社|Distance sensor and distance measurement method|

---

JP5999121B2|2014-02-17|2016-09-28|横河電機株式会社|Confocal light scanner|

---

EP3117234B1|2014-03-14|2021-04-28|Heptagon Micro Optics Pte. Ltd.|Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections|

---

US9874518B2|2014-04-22|2018-01-23|Sharp Kabushiki Kaisha|Optical sensor system, optical gas sensor system, particulate sensor system, light emitting apparatus, and image printing apparatus|

---

US20170026588A1|2014-05-01|2017-01-26|Rebellion Photonics, Inc.|Dual-band divided-aperture infra-red spectral imaging system|

---

US9754192B2|2014-06-30|2017-09-05|Microsoft Technology Licensing, Llc|Object detection utilizing geometric information fused with image data|

---

US9753351B2|2014-06-30|2017-09-05|Quanergy Systems, Inc.|Planar beam forming and steering optical phased array chip and method of using same|

---

US9575184B2|2014-07-03|2017-02-21|Continental Advanced Lidar Solutions Us, Inc.|LADAR sensor for a dense environment|

---

US10073166B2|2014-08-15|2018-09-11|Aeye, Inc.|Method and system for ladar transmission with spinning polygon mirror for dynamic scan patterns|

---

US9869753B2|2014-08-15|2018-01-16|Quanergy Systems, Inc.|Three-dimensional-mapping two-dimensional-scanning lidar based on one-dimensional-steering optical phased arrays and method of using same|

---

US10709365B2|2014-08-21|2020-07-14|I. R. Med Ltd.|System and method for noninvasive analysis of subcutaneous tissue|

---

EP3002548B1|2014-10-02|2016-09-14|Sick Ag|Illumination device and method for generating an illumination field|

---

US9772405B2|2014-10-06|2017-09-26|The Boeing Company|Backfilling clouds of 3D coordinates|

---

US10036803B2|2014-10-20|2018-07-31|Quanergy Systems, Inc.|Three-dimensional lidar sensor based on two-dimensional scanning of one-dimensional optical emitter and method of using same|

---

JP2016092146A|2014-10-31|2016-05-23|セイコーエプソン株式会社|Quantum interference device, atomic oscillator, electronic equipment and mobile body|

---

US9330464B1|2014-12-12|2016-05-03|Microsoft Technology Licensing, Llc|Depth camera feedback|

---

EP3045935A1|2015-01-13|2016-07-20|XenomatiX BVBA|Surround sensing system with dome-filter assembly|

---

EP3045936A1|2015-01-13|2016-07-20|XenomatiX BVBA|Surround sensing system with telecentric optics|

---

WO2016116733A1|2015-01-20|2016-07-28|Milan Momcilo Popovich|Holographic waveguide lidar|

---

WO2016125165A2|2015-02-05|2016-08-11|Verifood, Ltd.|Spectrometry system with visible aiming beam|

---

US9369689B1|2015-02-24|2016-06-14|HypeVR|Lidar stereo fusion live action 3D model video reconstruction for six degrees of freedom 360° volumetric virtual reality video|

---

US10215553B2|2015-03-12|2019-02-26|Apple Inc.|Thin PSD for laser-scanning systems|

---

US9529079B1|2015-03-26|2016-12-27|Google Inc.|Multiplexed multichannel photodetector|

---

US9880263B2|2015-04-06|2018-01-30|Waymo Llc|Long range steerable LIDAR system|

---

US9525863B2|2015-04-29|2016-12-20|Apple Inc.|Time-of-flight depth mapping with flexible scan pattern|

---

AU2017330180B2|2016-09-26|2019-06-27|Ouster, Inc.|Optical system for collecting distance information within a field|

---

US10063849B2|2015-09-24|2018-08-28|Ouster, Inc.|Optical system for collecting distance information within a field|

---

US9992477B2|2015-09-24|2018-06-05|Ouster, Inc.|Optical system for collecting distance information within a field|

---

US9866241B2|2015-09-25|2018-01-09|SK Hynix Inc.|Techniques for adaptive LDPC decoding|

---

EP3159711A1|2015-10-23|2017-04-26|Xenomatix NV|System and method for determining a distance to an object|

---

US10539661B2|2015-11-25|2020-01-21|Velodyne Lidar, Inc.|Three dimensional LIDAR system with targeted field of view|

---

EP3408677A4|2016-01-29|2019-10-09|Ouster, Inc.|Systems and methods for calibrating an optical distance sensor|

---

CA3012691A1|2016-01-31|2017-08-03|Velodyne Lidar, Inc.|Lidar based 3-d imaging with far-field illumination overlap|

---

US10627490B2|2016-01-31|2020-04-21|Velodyne Lidar, Inc.|Multiple pulse, LIDAR based 3-D imaging|

---

CA3017735A1|2016-03-19|2017-09-28|Velodyne Lidar, Inc.|Integrated illumination and detection for lidar based 3-d imaging|

---

US9983297B2|2016-03-21|2018-05-29|Veloyne Lidar, Inc.|LIDAR based 3-D imaging with varying illumination field density|

---

WO2017165316A1|2016-03-21|2017-09-28|Velodyne Lidar, Inc.|Lidar based 3-d imaging with varying pulse repetition|

---

CA3017819A1|2016-03-21|2017-09-28|Velodyne Lidar, Inc.|Lidar based 3-d imaging with varying illumination intensity|

---

US10291261B2|2016-04-25|2019-05-14|SK Hynix Inc.|Early selection decoding and automatic tuning|

---

CA3024510A1|2016-06-01|2017-12-07|Velodyne Lidar, Inc.|Multiple pixel scanning lidar|

---

US20180032396A1|2016-07-29|2018-02-01|Sandisk Technologies Llc|Generalized syndrome weights|

---

AU2017315762B2|2016-08-24|2020-04-09|Ouster, Inc.|Optical system for collecting distance information within a field|

---

EP3301477A1|2016-10-03|2018-04-04|Xenomatix NV|System for determining a distance to an object|

---

EP3301478A1|2016-10-03|2018-04-04|Xenomatix NV|System for determining a distance to an object|

---

EP3301480A1|2016-10-03|2018-04-04|Xenomatix NV|System and method for determining a distance to an object|

---

EP3301479A1|2016-10-03|2018-04-04|Xenomatix NV|Method for subtracting background light from an exposure value of a pixel in an imaging array, and pixel for use in same|

---

EP3316000A1|2016-10-28|2018-05-02|Xenomatix NV|Vehicular system for measuring a distance to an object and method of installing same|

---

EP3343246A1|2016-12-30|2018-07-04|Xenomatix NV|System for characterizing surroundings of a vehicle|

---

EP3392674A1|2017-04-23|2018-10-24|Xenomatix NV|A pixel structure|

---

CN110832349A|2017-05-15|2020-02-21|奥斯特公司|Augmenting panoramic LIDAR results with color|

---

JP2020521954A|2017-05-15|2020-07-27|アウスター インコーポレイテッド|Optical imaging transmitter with enhanced brightness|

---

US11016192B2|2017-07-05|2021-05-25|Ouster, Inc.|Light ranging device with MEMS scanned emitter array and synchronized electronically scanned sensor array|

---

US10700706B2|2017-09-22|2020-06-30|SK Hynix Inc.|Memory system with decoders and method of operating such memory system and decoders|

---

US10574274B2|2017-09-29|2020-02-25|Nyquist Semiconductor Limited|Systems and methods for decoding error correcting codes|

---

US11005503B2|2018-03-16|2021-05-11|SK Hynix Inc.|Memory system with hybrid decoding scheme and method of operating such memory system|

---

US10739189B2|2018-08-09|2020-08-11|Ouster, Inc.|Multispectral ranging/imaging sensor arrays and systems|

---

US20200116830A1|2018-08-09|2020-04-16|Ouster, Inc.|Channel-specific micro-optics for optical arrays|

---

US20200209355A1|2018-12-26|2020-07-02|Ouster, Inc.|Solid-state electronic scanning laser array with high-side and low-side switches for increased channels|US10063849B2|2015-09-24|2018-08-28|Ouster, Inc.|Optical system for collecting distance information within a field|

---

US9992477B2|2015-09-24|2018-06-05|Ouster, Inc.|Optical system for collecting distance information within a field|

---

EP3408677A4|2016-01-29|2019-10-09|Ouster, Inc.|Systems and methods for calibrating an optical distance sensor|

---

US10761195B2|2016-04-22|2020-09-01|OPSYS Tech Ltd.|Multi-wavelength LIDAR system|

---

EP3494372A4|2016-08-04|2020-03-25|Ophir Optronics Solutions Ltd.|A photometric test system for light emitting devices|

---

AU2017315762B2|2016-08-24|2020-04-09|Ouster, Inc.|Optical system for collecting distance information within a field|

---

US10605984B2|2016-12-01|2020-03-31|Waymo Llc|Array of waveguide diffusers for light detection using an aperture|

---

US10502618B2|2016-12-03|2019-12-10|Waymo Llc|Waveguide diffuser for light detection using an aperture|

---

DE102017101945A1|2017-02-01|2018-08-02|Osram Opto Semiconductors Gmbh|Measuring arrangement with an optical transmitter and an optical receiver|

---

EP3596492A4|2017-03-13|2020-12-16|Opsys Tech Ltd|Eye-safe scanning lidar system|

---

JP2020521954A|2017-05-15|2020-07-27|アウスター インコーポレイテッド|Optical imaging transmitter with enhanced brightness|

---

CN110832349A|2017-05-15|2020-02-21|奥斯特公司|Augmenting panoramic LIDAR results with color|

---

US11016192B2|2017-07-05|2021-05-25|Ouster, Inc.|Light ranging device with MEMS scanned emitter array and synchronized electronically scanned sensor array|

---

KR102326508B1|2017-07-28|2021-11-17|옵시스 테크 엘티디|Vcsel array lidar transmitter with small angular divergence|

---

US10791283B2|2017-09-01|2020-09-29|Facebook Technologies, Llc|Imaging device based on lens assembly with embedded filter|

---

US10785400B2|2017-10-09|2020-09-22|StmicroelectronicsLimited|Multiple fields of view time of flight sensor|

---

JP2019101244A|2017-12-04|2019-06-24|富士通株式会社|Optical module|

---

US10969490B2|2017-12-07|2021-04-06|Ouster, Inc.|Light ranging system with opposing circuit boards|

---

DE102018109544A1|2018-04-20|2019-10-24|Sick Ag|Optoelectronic sensor and method for distance determination|

---

DE102018118653B4|2018-08-01|2020-07-30|Sick Ag|Optoelectronic sensor and method for detecting an object|

---

US10739189B2|2018-08-09|2020-08-11|Ouster, Inc.|Multispectral ranging/imaging sensor arrays and systems|

---

US20200116830A1|2018-08-09|2020-04-16|Ouster, Inc.|Channel-specific micro-optics for optical arrays|

---

US20200088512A1|2018-09-18|2020-03-19|Shenzhen GOODIX Technology Co., Ltd.|Depth information construction system, associated electronic device, and method for constructing depth information|

---

US10852434B1|2018-12-11|2020-12-01|Facebook Technologies, Llc|Depth camera assembly using fringe interferometery via multiple wavelengths|

---

EP3699640B1|2019-02-19|2022-01-26|Sick Ag|Optoelectronic sensor and method for detecting an object|

---

EP3948344A1|2019-05-01|2022-02-09|Sense Photonics, Inc.|Event driven shared memory pixel|

---

US10701326B1|2019-07-10|2020-06-30|Lightspace Technologies, SIA|Image display system, method of operating image display system and image projecting device|

---

KR20210020469A|2019-08-14|2021-02-24|삼성전자주식회사|Spectral camera|

---

DE102019126982A1|2019-10-08|2021-04-08|Sick Ag|Optoelectronic sensor and method for detecting objects|

---

DE102019129986A1|2019-11-07|2021-05-12|Sick Ag|Optoelectronic sensor and method for detecting objects|

---

CN111123239A|2019-12-20|2020-05-08|深圳市速腾聚创科技有限公司|Receiving device, transmitting/receiving device, and laser radar|

---

DE102020102247A1|2020-01-30|2021-08-05|Sick Ag|Optoelectronic sensor and method for detecting objects|

法律状态:
2019-04-30| PAT| Application published|Effective date: 20190423 |

优先权:

---

申请号 | 申请日 | 专利标题

---

US201562232222P| true| 2015-09-24|2015-09-24|

---

US15/276,532|2016-09-26|

---

US15/276,532|US9992477B2|2015-09-24|2016-09-26|Optical system for collecting distance information within a field|

---

PCT/US2017/039306|WO2018057084A1|2015-09-24|2017-06-26|Optical system for collecting distance information within a field|

---